WRe Contact Probes
Semiconductor contact probes require high-purity and high-precision materials, which can be alloy probes made of rhenium-tungsten alloys, or tungsten probes made of pure tungsten.
Among them, the contact resistance of rhenium-tungsten alloy is slightly higher than that of tungsten and its fatigue resistance is similar. Compared with pure tungsten, the lattice structure of rhenium-tungsten alloy is tighter, so the surface of rhenium-tungsten probe tip is smoother. This means that the tips of rhenium-tungsten contact probes (WRe contact probes) are less likely to be contaminated, are easier to clean, and have a more stable contact resistance than tungsten.
In semiconductor testing, other parameters of the probe will also affect the test results, such as the diameter and shape of the tip, contact pressure, and the flatness of the probe station, etc. Therefore, the WRe contact probe has an ultra-fine needle tip, the surface is smooth and non-damaging, and the finish can reach Ra0.25 or more.
If there is any interest in tungsten products, please feel free to contact us through the following methods.
Email: sales@chinatungsten.com
Tel.: +86 592 512 9696/+86 592 512 9595
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